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Keywords: Semiconductor Detectors
TU-J345-GePD-F3-1Beam Quality Conversion Factor of a MicroDiamond Detector in Flattened and Un-Flattened High-Energy Photon Beams
T Saitou*1,2, K Hirayama1,2,3, M Shimizu2, Y Morishita2, K Okudaira4, T Kamomae5, H Oguchi5, M Sato1, M Hoshina1, (1) Komazawa University, Setagaya, Tokyo, (2) National Metrology Institute of Japan, Tsukuba, Ibaraki, (3) National Cancer Center Hospital East, Kashiwa, Chiba, (4) Nagoya University Hospital, Nagoya, Aichi, (5) Nagoya University Graduate School of Medicine, Nagoya, Aichi
WE-C930-GePD-F7-5Innovative Solid State Detectors For New Beam Monitoring In Proton Therapy
A Vignati1*, Z Ahmadi Ganjeh2 , M Boscardin3,4 , N Cartiglia1 , M Donetti5 , G Dalla Betta4,6 , F Fausti1 , M Ferrero1 , F Ficorella3,4 , S Giordanengo1 , O Hammad Ali1,7 , M Mandurrino1 , F Marchetto1, F Mas Milian7,8 , M. Mohammadian-Behbahani9, V Monaco1,7 , L Pancheri6 , G Paternoster3,4 , R Sacchi1,7 , V Sola1 , A Staiano1 , R Cirio1,7, (1) INFN - National Institute for Nuclear Physics, Torino, TO, Italy (2) Yazd university, Yazd, Iran (3) Bruno Kessler Foundation, Trento, Italy (4) TIFPA, INFN, Trento, Italy (5) Fondazione CNAO, Pavia, Italy (6) Universita degli Studi di Trento, Trento, Italy (7) Universita degli Studi di Torino, Torino, Italy (8) Universidade Estadual de Santa Cruz, Ilheus, Brazil (9) Amirkabir University of Technology (Tehran Polytechnic), Tehran, Iran